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RMDA29000 June 2004 RMDA29000 27-31 GHz Drive Amplifier MMIC General Description The Fairchild Semiconductor RMDA29000 is a high efficiency driver amplifier designed for use in point to point and point to multi-point radios, and various communications applications. The RMDA29000 is a 3-stage GaAs MMIC amplifier utilizing our advanced 0.15m gate length Power PHEMT process and can be used in conjunction with other driver or power amplifiers to achieve the required total power output. Features * 22dB small signal gain (typ.) * 23dBm saturated power out (typ.) * Circuit contains individual source Vias * Chip Size 3.41mm x 1.62mm Device Absolute Ratings Symbol Vd Vg Vdg ID PIN TC TSTG Rjc Parameter Positive DC Voltage (+5V Typical) Negative DC Voltage Simultaneous (Vd-Vg) Positive DC Current RF Input Power (from 50 source) Operating Baseplate Temperature Storage Temperature Range Thermal Resistance (Channel to Backside) Ratings +6 -2 +8 360 +10 -30 to +85 -55 to +125 38 Units V V V mA dBm C C C/W (c)2004 Fairchild Semiconductor Corporation RMDA29000 Rev. C RMDA29000 Electrical Characteristics (At 25C), 50 system, Vd = +5V, Quiescent current (Idg) = 250mA Parameter Frequency Range Gate Supply Voltage1 (Vg) Gain Small Signal Gain Variation vs. Frequency Power Output at 1dBm Compression Power Output Saturated: (Pin = +4dBm) Drain Current Small Signal Drain Current at P1dB Compression Power Added Efficiency (PAE): at P1db OIP32 Input Return Loss Output Return Loss Note: 1: Typical range of negative gate voltages is -0.9 to 0.0V to set typical Idq of 250mA. 2: 10MHz tone separation measured at 10dBm Power Out/tone. Min 27 18 Typ -0.4 22 1 21 23 250 270 8 30 10 8 Max 31 28 21 5 5 Units GHz V dB dB dBm dBm mA mA % dBm dB dB (c)2004 Fairchild Semiconductor Corporation RMDA29000 Rev. C RMDA29000 Application Information CAUTION: THIS IS AN ESD SENSITIVE DEVICE. Chip carrier material should be selected to have GaAs compatible thermal coefficient of expansion and high thermal conductivity such as copper molybdenum or copper tungsten. The chip carrier should be machined, finished flat, plated with gold over nickel and should be capable of withstanding 325C for 15 minutes. Die attachment should utilize Gold/Tin (80/20) eutectic alloy solder and should avoid hydrogen environment for PHEMT devices. Note that the backside of the chip is gold plated and is used as RF and DC ground. These GaAs devices should be handled with care and stored in dry nitrogen environment to prevent contamination of bonding surfaces. These are ESD sensitive devices and should be handled with appropriate precaution including the use of wrist grounding straps. All die attach and wire/ribbon bond equipment must be well grounded to prevent static discharges through the device. Recommended wire bonding uses 3 mils wide and 0.5 mil thick gold ribbon with lengths as short as practical allowing for appropriate stress relief. The RF input and output bonds should be typically 0.012" long corresponding to a typical 2 mil gap between the chip and the substrate material. DRAIN SUPPLY Vd MMIC CHIP RF IN RF OUT GROUND (Back of the Chip) GATE SUPPLY Vg Figure 1. Functional Block Diagram 0.427 2.157 3.242 1.621 1.514 1.105 0.898 0.704 0.0 0.642 0.0 Dimensions in mm 2.375 3.236 3.405 Figure 2. Chip Layout and Bond Pad Locations (Chip Size is 3.405mm x 1.621mm x 50m Typical. Back of chip is RF and DC Ground) (c)2004 Fairchild Semiconductor Corporation RMDA29000 Rev. C RMDA29000 DRAIN SUPPLY Vd = +5V 10000pF L BOND WIRE Ls L MMIC CHIP 10 0pF RF IN RF OUT L GROUND (Back of Chip) BOND WIRE Ls 10 0pF L 10000pF GATE SUPPLY Vg Figure 3. Recommended Application Schematic Circuit Diagram Vdd (POSITIVE) 2 MIL GAP DIE-ATTACH 80Au/20Sn 10000pF 100pF ALUMINA 50 ALUMINA 50 RF INPUT RF OUTPUT 100pF L < 0.015" (4 Places) 10000pF Vg (NEGATIVE) Note: Use 0.003" by 0.0005" Gold Ribbon for bonding. RF input and output bonds should be less than 0.015" long with stress relief. Vd should be biased from 1 supply as shown. Vg should be biased from 1 supply. Figure 4. Recommended Assembly Diagram (c)2004 Fairchild Semiconductor Corporation RMDA29000 Rev. C RMDA29000 Recommended Procedure for Biasing and Operation CAUTION: LOSS OF GATE VOLTAGE (Vg) WHILE DRAIN VOLTAGE (Vd) IS PRESENT MAY DAMAGE THE AMPLIFIER CHIP. The following sequence of steps must be followed to properly test the amplifier: Step 1: Turn off RF input power. Step 2: Connect the DC supply grounds to the ground of the chip carrier. Slowly apply negative gate bias supply voltage of -1.5V to Vg. Step 3: Slowly apply positive drain bias supply voltage of +5V to Vd. Step 4: Adjust gate bias voltage to set the quiescent current of Idq = 250mA. Step 5: After the bias condition is established, the RF input signal may now be applied at the appropriate frequency band. Step 6: Follow turn-off sequence of: (i) Turn off RF input power, (ii) Turn down and off drain voltage (Vd), (iii) Turn down and off gate bias voltage (Vg). An example auto bias sequencing circuit to apply negative gate voltage and positive drain voltage for the above procedure is shown below. D3 D1N6098 +6V D2 D1N6098 R1 3.0k + V+ 0 1 2 C1 0.1F R3 1.0k * U2 AD820/AD V- LM2941T U1A 7400 3 2 CNT 5 4 IN OUT 3 GND -2.62V R4 1.2k - MMIC_+VDD C3 22F R2 6.8k 0 0 C2 0.47F R6 1k ADJ 1 0 0 R5 3k 0 *Adj. For -Vg MMIC_-VG C4 0.1F R7 8.2k R8 1.0k 0 0 -5V *-5V Off: +3.33V -5V Off: +1.80V 0 C5 0.1F (c)2004 Fairchild Semiconductor Corporation RMDA29000 Rev. C RMDA29000 Typical Characteristics RMDA29000 S-Parameters vs. Frequency 5V, 250mA, T = 25C 30 25 S21 20 15 10 Sij (dB) 5 0 -5 -10 -15 -20 24 25 26 27 28 29 30 31 32 33 34 S11 S22 FREQUENCY (GHz) RMDA29000 S21 vs. Frequency Over Temperature 5V, 250mA 35 -35C 30 25 +85C S21 (dB) 20 +25C 15 10 5 0 26 27 28 29 FREQUENCY (GHz) 30 31 32 (c)2004 Fairchild Semiconductor Corporation RMDA29000 Rev. C RMDA29000 Typical Characteristics (Continued) RMDA29000 Gain vs. Pout 5V, 250mA, T = 25C 29 27 30GHz 25 23 29GHz 31GHz 28GHz 27GHz 21 19 17 15 13 0 5 10 15 20 25 30 GAIN (dB) Pout (GHz) RMDA29000 PIP3 vs. Pout/Tone 10 MHz Tone Sep 5V, 250mA, T = 25C 40 35 28GHz 31GHz 29GHz 30GHz OIP3L (dBm) 30 27GHz 25 20 15 0 5 10 15 Pout/TONE (dBm) 20 25 (c)2004 Fairchild Semiconductor Corporation RMDA29000 Rev. C TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACExTM FAST ActiveArrayTM FASTrTM BottomlessTM FPSTM CoolFETTM FRFETTM CROSSVOLTTM GlobalOptoisolatorTM DOMETM GTOTM EcoSPARKTM HiSeCTM E2CMOSTM I2CTM EnSignaTM i-LoTM FACTTM ImpliedDisconnectTM FACT Quiet SeriesTM ISOPLANARTM LittleFETTM MICROCOUPLERTM MicroFETTM MicroPakTM MICROWIRETM MSXTM MSXProTM OCXTM OCXProTM OPTOLOGIC Across the board. Around the world.TM OPTOPLANARTM PACMANTM The Power Franchise POPTM Programmable Active DroopTM Power247TM PowerSaverTM PowerTrench QFET QSTM QT OptoelectronicsTM Quiet SeriesTM RapidConfigureTM RapidConnectTM SerDesTM SILENT SWITCHER SMART STARTTM SPMTM StealthTM SuperFETTM SuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 SyncFETTM TinyLogic TINYOPTOTM TruTranslationTM UHCTM UltraFET VCXTM DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component is any component of a life 1. Life support devices or systems are devices or support device or system whose failure to perform can systems which, (a) are intended for surgical implant into be reasonably expected to cause the failure of the life the body, or (b) support or sustain life, or (c) whose support device or system, or to affect its safety or failure to perform when properly used in accordance with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Product Status Formative or In Design Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Preliminary First Production No Identification Needed Full Production Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. I11 |
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